THS4513-SP - Rad-Tolerant Class V, Wideband, Fully Differential Amplifier

Updated : 2020-01-09 14:17:41
Description

The THS4513 is a wideband, fully differential op amp designed for 3.3 V to 5 V data-acquisition systems. It has very low noise at 2.2 nV/ load. Slew rate is very high at 5100 V/µs and with settling time of 5.5 ns to 1% (2 V step), it is ideal for pulsed applications. It is suitable for minimum gain of 6 dB.

To allow for dc coupling to ADCs, its unique output common-mode control circuit maintains the output common-mode voltage within 5 mV offset (typ) from the set voltage, when set within 0.5 V of mid-supply, with less than 4 mV differential offset voltage. The common-mode set point is set to mid-supply by internal circuitry, which may be over-driven from an external source.

The input and output are optimized for best performance with their common-mode voltages set to mid-supply. Along with high performance at low power supply voltage, this makes for extremely high performance single supply 5 V data acquisition systems.

The THS4513 is offered in a 16-pin ceramic flatpack package (W), and is characterized for operation over the full military temperature range from -55°C to 125°C.

Products containing the "THS4513-SP" keyword are: THS4513-SP , THS4513-SP(5962-0722301
Features

  • Fully Differential Architecture
  • Centered Input Common-Mode Range
  • Minimum Gain of 2V/V (6 dB)
  • Bandwidth: 1100 MHz (Gain = 6 dB)
  • Slew Rate: 5100 V/µs
  • 1% Settling Time: 5.5 ns
  • HD2: -76 dBc at 70 MHz
  • HD3: -88 dBc at 70 MHz
  • OIP2:84 dBm at 70 MHz
  • OIP3: 42 dBm at 70 MHz
  • Input Voltage Noise: 2.2 nV/Hz (f >10 MHz)
  • Noise Figure: 19.8 dB
  • Output Common-Mode Control
  • Power Supply:
    • Voltage: 3 V (±1.5 V) to 5 V (±2.5 V)
    • Current: 37.7 mA
  • Power-Down Capability: 0.65 mA
  • Rad-Tolerant: 150 kRad (Si) TID
  • QML-V Qualified, SMD 5962-07223
  • APPLICATIONS
    • 5 V Data-Acquisition Systems
    • High-Linearity ADC Amplifier
    • Wireless Communication
    • Medical Imaging
    • Test and Measurement