SN74LVC2G08-EP - Enhanced Product Dual 2-Input Positive-And Gate

This dual 2-input positive-AND gate is designed for 1.65-V to 5.5-V V_CC operation.

The SN74LVC2G08 performs the Boolean function Y = A • or Y = A\ + B\ in positive logic.

This device is fully specified for partial-power-down applications using I_off. The I_off circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

• Controlled Baseline
  • One Assembly
  • One Test Site
  • One Fabrication Site
• Enhanced Diminishing Manufacturing Sources (DMS) Support
• Enhanced Product-Change Notification
• Qualification Pedigree⁽¹⁾
• Supports 5-V V_CC Operation
• Inputs Accept Voltages to 5.5 V
• Max t_pd of 5.7 ns at 3.3 V
• Low Power Consumption, 10 µA Max I_CC
• ±24 mA Output Drive at 3.3 V
• Typical V_OLP (Output Ground Bounce) <0.8 V at V_CC = 3.3 V, T_A = 25°C
• Typical V_OHV (Output V_OH Undershoot)>2 V at V_CC = 3.3 V, T_A = 25°C
• I_off Supports Partial-Power-Down Mode Operation
• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
• ESD Protection Exceeds JESD 22
  • 2000-V Human-Body Model (A114-A)
  • 1000-V Charged-Device Model (C101)

⁽¹⁾ Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.