SN74AHCT00-EP - Enhanced Product Quadruple 2-Input Positive-Nand Gates

Updated : 2020-01-09 14:37:11
Description

The ’AHCT00 device performs the Boolean function Y = (A • B)\ or Y = A\ + B\ in positive logic.

Features

  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • Inputs Are TTL-Voltage Compatible
  • Latch-Up Performance Exceeds 250 mA Per JESD 17
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetalliclife, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Parametrics
StatusACTIVE
SubFamilyNAND gate
Technology FamilyAHCT
VCC5.5
Channels4
Inputs per channel2
ICC @ nom voltage0.02
IOL8
IOH-8
Input typeTTL-Compatible CMOS
Output typePush-Pull
FeaturesOver-Voltage Tolerant Inputs^Very High Speed (tpd 5-10ns)
Data rate70
RatingHiRel Enhanced Product
Operating temperature range-55 to 125
Package GroupSOIC|14
Package size: mm2:W x L (PKG)[pf]14SOIC[/pf]: 52 mm2: 6 x 8.65 (SOIC|14)
Approx. price0.39 | 1ku