TLC2543-EP - Enhanced Product 12-Bit Analog-to-Digital Converter (ADC) With Serial Control and 11 Analog Inputs

The TLC2543 is a 12-bit, switched-capacitor, successive-approximation, analog-to-digital converter (ADC). This device, with three control inputs [chip select (CS), input-output clock (I/O CLOCK), and address input (DATA INPUT)], is designed for communication with the serial port of a host processor or peripheral through a serial 3-state output. The device allows high-speed data transfers from the host.

In addition to the high-speed converter and versatile control capability, the device has an on-chip 14-channel multiplexer that can select any 1 of 11 inputs or any 1 of 3 internal self-test voltages. The sample-and-hold function is automatic. At the end of conversion, the end-of-conversion (EOC) output goes high to indicate that conversion is complete. The converter incorporated in the device features differential high-impedance reference inputs that facilitate ratiometric conversion, scaling, and isolation of analog circuitry from logic and supply noise. A switched-capacitor design allows low-error conversion over the full operating temperature range.

• Controlled Baseline
  • One Assembly/Test Site, One Fabrication Site
• Extended Temperature Performance of -40°C to 125°C (TLC2543Q) and -55°C to 125°C (TLC2543M)
• Enhanced Diminishing Manufacturing Sources (DMS) Support
• Enhanced Product Change Notification
• Qualification Pedigree⁽¹⁾
• 12-Bit-Resolution Analog-to-Digital Converter (ADC)
• 10-µs Conversion Time Over Operating Temperature
• 11 Analog Input Channels
• Three Built-In Self-Test Modes
• Inherent Sample-and-Hold Function
• Linearity Error . . . ±1 LSB Max
• On-Chip System Clock
• End-of-Conversion (EOC) Output
• Unipolar or Bipolar Output Operation (Signed Binary With Respect to 1/2 the Applied Voltage Reference)
• Programmable Most Significant Bit (MSB) or Least Significant Bit (LSB) First
• Programmable Power Down
• Programmable Output Data Length
• CMOS Technology
• Application Report Available⁽²⁾

⁽¹⁾ Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

⁽²⁾ Microcontroller Based Data Acquisition Using the TLC2543 12-bit Serial-Out ADC (SLAA012)