SN74LV595A-EP - Enhanced Product 8-Bit Shift Registers With 3-State Output Registers

The SN74LV595A device is an 8-bit shift register designed for 2-V to 5.5-V V_CC operation.

This device contains an 8-bit serial-in, parallel-out shift register that feeds an 8-bit D-type storage register. The storage register has parallel 3-state outputs. Separate clocks are provided for both the shift and storage register. The shift register has a direct overriding clear (SRCLR)\ input, serial (SER) input, and a serial output for cascading. When the output-enable (OE)\ input is high, all outputs except Q_H’ are in the high-impedance state.

Both the shift register clock (SRCLK) and storage register clock (RCLK) are positive-edge triggered. If both clocks are connected together, the shift register always is one clock pulse ahead of the storage register.

To ensure the high-impedance state during power up or power down, OE\ should be tied to V_CC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

The device is fully specified for partial-power-down applications using I_off. The I_off circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

• Controlled Baseline
  • One Assembly/Test Site, One Fabrication Site
• Enhanced Diminishing Manufacturing Sources (DMS) Support
• Enhanced Product-Change Notification
• Qualification Pedigree
• 2-V to 5.5-V V_CC Operation
• Max t_pd of 7.4 ns at 5 V
• Typical V_OLP (Output Ground Bounce)
     <0.8 V at V_CC = 3.3 V, T_A = 25°C
• Typical V_OHV (Output V_OH Undershoot)
     >2.3 V at V_CC = 3.3 V, T_A = 25°C
• Support Mixed-Mode Voltage Operation on All Ports
• 8-Bit Serial-In, Parallel-Out Shift
• I_off Supports Partial-Power-Down Mode Operation
• Shift Register Has Direct Clear

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.